They are G6SU-2 (3V latching) or G6S-2 parts, depending on dedicated function. These are not reed switches. Through-hole versions.
As I've said, this didn't appear to be a relay issue.
I would normally only use sockets in a burn-in or other dedicated test fixtures. They then determine when the fixture gets scrapped (ie number of insertions).
The most damage-prone features of these pluggins (apart from the FW issue raised here) seemed at one time to be the screw terminals used as sensor connection and the backplane connector.
You know about the Supertex/MicroChip HV analog switches, right? Electrically not nearly as nice as relays but much faster and presumably more reliable for long term use. e.g. HV2662 .
The current is probably due to CMOS' multilayer doping structure; one or th e other of the CMOS polarities will always have an accidental PNP or NPN transistor parasitic. Thus, there may be leakage from the channel to the substrate. That curre nt only passes when the device is ON and carrying high-ish currents, and of course the wor st-case current will be at high temperature.
If I were making a busy-box tester, there would be 68 wires of logic-level ports with analog switch or tristate transceivers, and maybe a dozen relay chann els. Then, I'd configure the output ports using a whopping 128-pin Euro connecto r and jumper board to determine which wires connect to what. You'd want a hard-wired configuration code on the jumper board, to be sure your test jig puts the HV/high-current relays in the appropriate place before activat ing a test.
This reminds me of a project with a lot of cable-harness parts, where a tes t jig was designed that probed for opens, shorts, etcetera. The jig took a week to design and build. Testing all the cables took an hour and a half. Then, when the jig was ready to scrap; no one could do it. It sat on a shelf for a few years, I'm told...
I believe he said that. The issue is not how they compare to relays. The issue is how they compare to your requirements. Relays exceed the specs for transistors in many respects, but you wouldn't design a switching power supply with a relay as the switch.
Judging from some of the specs of your product, are you convinced that valid test measurements can be made for all of the features of the product through relay contacts and structures?
Making a universal test bed often requires serious compromise, or dedicated interface fittings.
I think it will work. I'll have folks review the test set against every product to be tested, to cach the whatever things I've missed.
We won't use this for our picosecond products, just for the DC and low frequency stuff. I don't think that stray capacitance or contact resistance will be a problem, and I hope that leakage won't either. The only resistance measurements that really matter will be 4-wire.
A sorta universal test set has a lot of appeal. Otherwise, we have to design a test fixture per product, which can be almost as much work as the product design.
If a test set is a properly documented PC board (and not some hand-wired hack) we can build a bunch of them and have a few spares in a closet. And make more any time we need them. It's possible that customers might want one too.
Yes, that's half the problem solved. But, relays with DIP pinout are usually equipped with stamped-sheet pins, and a broken or bent pin is a failure. For best reliability, you want relays with machine-pins, in machined-socket receptacles. They exist.
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