I have been having seemingly random noise problems where my PIC-based USB device will go into a USBSuspendControl state, and it requires the cable to be removed and replaced to reestablish communication. The problem usually occurs in the field where there is switching of high current and high voltage, but I was able to duplicate it to some extent by running the USB cable along an AC power line to a current source which I switched on and off.
Recently I suspected that the USB cable itself might be at fault, because I had bought a batch of 100 pieces for $0.69 each (but now about $1.50) from
So, I dissected one of the new cables by removing the PVC jacket in the middle, and I found a substantial tinned copper braid shield, and an aluminized Mylar wrap under that. When I removed the shield I could see that the four USB conductors were twisted together, which is generally good for noise induced by strong magnetic fields. So far, so good.
But when I measured continuity from the connector shells to the exposed shield, I got intermittent readings of about 3 to 30 ohms and sometimes an open circuit. Then I measured the continuity from shell to shell on a couple other USB cables I had been using, and I found that one showed an open circuit and the others showed intermittent. This was the case for two new cables from different sources. Yet I measured the shells of a USB cable for my Nikon digital camera (with a mini-USB on the camera end), and I got a solid connection of less than 1 ohm.
I still need to do more testing and I may also purchase a high grade cable with gold plated connectors and better shielding. They are about $20. I will also have my customer check the continuity and try a better cable. Perhaps a USB 3.0 cable will work better.
I removed the PVC molded cover for the male type "A" connector, and there is a metal shell that extends back and tapers to a smaller "neck" where the cable is clinched or crimped. By bending the ears on the crimp I was able to separate part of the metal housing to reveal where the shield has been folded back and exposed so that the inner surface of the housing presses against it. But it seems that the jacket of the cable is a continuous molding that fills the shell of the connector, and the crimp mechanism can only apply light force to the exposed part of the shield. So the actual connection may degrade with time as a non-conductive film may form on the metal surfaces, and mechanical flexing may further degrade the connection.
Here are pictures of the cable after dissection and exposure of the crimped shield connection:
I think this is a design defect and I should be able to get a refund or credit for the unused cables. It may not be the reason for the problem but I should be able to determine that if my customers replace the cables with high performance versions and their problems are greatly reduced.
Anyone else have experience with this? One member of the Microchip forums reported that he found the following with some new cables he had on hand:
Poundland 1.8 m A-A(F) yellow 8 ohms Signalex 1.5 m A-A(F) white OPEN CIRCUIT! Signalex 1.5 m A-B white OPEN CIRCUIT! CPC 1.8 m A-B translucent yellow 18.5 ohms IXIOS 3 m A-A(F) translucent/silver grey gold plated connectors