In the current data sheets corresponding to Toshiba and Samsung Nand Flash device, invalid blocks are detected by verifying the content of the address 517 on the first page of each block, as specified in SSFDC standard. In the old NAND data sheets, the way to detect these was checking the whole content on the first page of each block by being different to 0xff. What I am writing is an independent generic device driver. Can I assume that the invalid blocks detection is the first one described above? If not, do you have any suggestion?
Thanks in advance !