I was wondering just how bad data is corrupted through repeated conversions. I have this idea to test it and was wondering how hard it would be to set up.
Essentially you have a ADC, DAC, buffer, and control system.
you initially setup the buffer with the required digital data.
Then the buffer sends the data into the DAC and the DAC feeds the ADC which then goes back into the buffer. The control system handles all the necessary stuff and counts each time a full conversion of the buffer has happened.
DAC -------> ADC ^ / \\ / \\ / \\ / \\ / \\ V Buffer
After the nth conversion(of the buffer) you can then compare the buffer with the original data and see just how different it really is.
I'm wondering if such a system could be designed to handle virtually and DAC and ADC for testing purposes?