That's true but these components will also prevent others from failing. That isn't what the reliability numbers show, however.
The numbers are silly and they way they're normally used is even worse. It's the old "be careful what you ask for because you're likely to get it".
I find it very hard to believe that input protection networks increase the field return rate.
Cheers
Phil Hobbs
-- Dr Philip C D Hobbs Principal Consultant ElectroOptical Innovations LLC Optics, Electro-optics, Photonics, Analog Electronics 160 North State Road #203 Briarcliff Manor NY 10510 hobbs at electrooptical dot net http://electrooptical.net
Hey, those current limiters on power output stages and those overtemperature shutdown circuits increase the FIT rates!
-- John Larkin Highland Technology Inc www.highlandtechnology.com jlarkin at highlandtechnology dot com Precision electronic instrumentation Picosecond-resolution Digital Delay and Pulse generators Custom timing and laser controllers Photonics and fiberoptic TTL data links VME analog, thermocouple, LVDT, synchro, tachometer Multichannel arbitrary waveform generators
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Unfortunately not so. The relevant manager has her/his eye altogether too closely on the quarterly figures that determine his/her bonus to do that. That preempts the preventative maintenance.
And it might have been the result of a PUC or Court order, both rather non-negotioable. It is amazing how the CA PUC suddenly developed some teeth after the San Bruno disaster.
reasons,
That's not all; the new memory wasn't any faster or that much lower power. A long time a go (~ 40 years) i worked on computer that used core with
120 ns access time and 300 ns cycle time, faster than DRAM nearly 20 years later.
Which still hasn't changed much; RAS/CAS cycle times are around, erm, I see figures around 10ns. Quite a bit less in absolute terms, but with CPU clock rates over a thousand times higher, it simply hasn't scaled accordingly. I/O is even worse; one figure puts PCIe latency on the order of a microsecond (I forget if that's fractional or multiple us?), absolutely no different from the old ISA bus (8MHz, though only 8 bit).
Tim
-- Seven Transistor Labs Electrical Engineering Consultation Website: http://seventransistorlabs.com
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overtemperature
This discussion reminds me of a bit of conversation i once overheard. The discussion was about some new (back then) high energy density metallized film capacitors. The goal energy density was something like 20 mF*V per in^3 at 400 V. The manufacturer could make them with a lifetime of 200 to
300 hours. The operational goal was 168 hours. The problem arose when the customer insisted on 168 hour burn-in on 100% of the parts. After burn-in they could no longer meet operational goals due to the limited life. IIRC the infant mortality period was something like 2 hours at 120 % rated voltage. Never did hear how it all worked out though.?-)
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