Spartan III I/O robustness

I was not able to find a way to continue the old thread (too old??), but my basic question was:

I have spent the last 60 days trying to get an answer from Xilinx on > their new S3 devices. During a review, it was stated that the new S3s > were very sensitive to transients on the I/O pins. Because they made a > point to mention this during the review, I posed the following > question to Xilinx: > > "If we look at the incident versus reflected energy and tune the stub > (trace) > for a worst case match is it possible the driver could be damaged or > the > chip lock up due to the reflected energy?" > > "The circuit would be as follows: > Spartan III Output ------------------------------ Tunable Stub" > > I wonder if anyone in this group has asked this question and what was > the responce from Xilinx?

Just do a search for reflected in the comp.arch.fpga group and you should find the entire thread, or try:

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I just got this information that may be of interest to some of you.

Subject: Spartan 3E / 4 information >Apparently the problem with past parts was that the I/O was really
2.5V so when >boosting up to 3.3 already took away most of the overshoot window. This new
revision should correct this. I believe this is preliminary info, but

yes this >is meant to resolve the reflected signal issue. Apparently this issue is also >in other parts, I believe the Virtex II.

What I find interesting is that after all the feedback from Xilinx on this subject that they may change the technology to address this concern.

Reply to
lecroy
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[snip]

Sorry I missed this one the first time around. Some of the confusion might be due to initial early Spartan-3 FPGA engineering samples that did not officially support 3.3V I/O. The Spartan-3 FPGAs available today do support

3.3V I/O.

Xilinx recommends limiting overshoot/undershoot to less than 500 mV so as not to turn on the I/O protection diodes. Consequently, the recommended voltage at the I/O pad should never be lower than 0.5V or more than VCCO+0.5V. In all the HyperLynx IBIS board simulations that I've done, I've never seen a case where the output created a voltage that it could not tolerate. Certainly, the destinations may see a higher voltage depending on I/O drive strength and trace length. Consequently, you may need to terminate the signal for the voltage on the receiving end. That said, there may be some sort of pathological case that I have not seen in practical designs.

--------------------------------- Steven K. Knapp Applications Manager, Xilinx Inc. General Products Division Spartan-3/II/IIE FPGAs

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--------------------------------- Spartan-3: Make it Your ASIC

Reply to
Steven K. Knapp

Just thought I would post the remainder of the conversation. Hope it helps some of you. Also, if anyone has the orignal documents that call out the 10% matching, could you pass this on to Steve or post it.

Most recent first.

caught my attention. I asked for a copy of the slides but they would not release them. Later I found this same specification called out in one of the application notes. I did a quick search, but it appears Xilinx has changed many of these documents several times over from that time and there is no mention of the matching. On the plus side, I think I may have kept my orignal copies at home. I will see if I can dig them up and pass them onto you.

Ahhh, that could be. The official Xilinx word on I/O robustness, I think, was overly conservative until the actual process qualification was complete. Some of the early values were indeed extremely limiting.

I'd still be interested if you come across those documents, just to make sure we purge the old data.

Thanks.

Hi Anonymous,

Question: Do you happen to go by another name? Why the anonymity? I promise, I don't bite. :-)

matching inputs. They are asking for an impedance match of less than

10%. My question is about the reflected energy from a driver to a poorly terminated load. So, if we look at the incident versus reflected energy and tune the stub (trace) for a worst case match is it possible the driver could be damaged or the chip lock up due to the reflected energy?"

simulation. So, while your simulation may be showing you one thing, to meet this 10% is going to take a "real" board and a VNA to verify. If we have a mismatch of say 12%, how does that effect the life of the part? What drove the designers to 10% limit?

Sorry, I've been reading through the volumous thread. I did note that the thread has some old information. Back when the question was asked, we hadn't yet completed all our process qualification steps and the engineers asked us to keep the input voltage to 3.75V or less, with total overshoot of +/-300 mV. This has since been relaxed to +/-500 mV, with an absolute maximum voltage of 4.05V.

Was the 10% matching based on the 300 mV numbers? I'm not sure from where that value originated.

In the diagram that I sent, there is a small amount of time where the voltage on the input exceeds 4.05V. Above this voltage, there is the possibility of a long-term wear out mechanism called Time Dependent Dielectric Breakdown (TDDB). Voltages above 4.05V will not immediately cause the device to fail and it will not cause the chip to lock up. Essentially, you will see the output leak more and more current until it eventually fails. The time to failure depends on the magnitude of the overvoltage and the duration.

Does this help at all with your original question? Is there additional information that you would like.

---------------------------------

Hi Anonymous and Hal,

question, the answer back from the factory is at

This was followed by several posts about the importance of simulation.

Based on your initial question, I tried a few simulations using some pathological conditions and, yes, it is possible to exceed the Absolute Maximum Ratings listed in the data sheet. For example, if you use the biggest, fastest output available (LVCMOS_FAST_24mA), operate it at maximum voltage (VCCO=3.45V), run it down a long trace (100 cm), simulate it under worst-case conditions, to an high-impedance load, you can exceed 4.05V absolute maximum rating at the Spartan-3 FPGA output for about 1 ns. Add a 33 ohm source termination resistor or reduce the trace length to 15 cm and you easily fall within the recommended VCCO+/-0.5V range. Similar effects are possible using a different I/O standard. I purposely picked the biggest current drive output with the fastest switching edges and used the Fast-Strong simulation model (worst-case to generate maximum overshoot/undershoot).

In every PCB simulation that I've done so far, and certainly the scope shots from actual silicon, look better than this. IBIS provides an excellent first-order approximation of the actual results. However, this simple analysis isn't modeling packaging loads, etc.

Attached is a PDF showing the results.

I also checked with Xilinx design engineering. Before device qualification was complete, they wanted to limit the recommended maximum voltage on the inputs to no more than 3.75V (VCCO+0.3V). This has since been relaxed to VCCO+0.5V, or 3.95V.

Please let me know if this answers your question or not.

Reply to
lecroy

?,

Is there a question here that I could answer for someone?

It is unclear what is being asked.

DCI accuracy? IO SI issues with 3.3V and the 4.05 V abs max specification? What happens if the IO spends time at and beyond the

4.05V gate stress abs max limits?

I can answer any, or all if anyone wants to know.

The answers will also apply to VII Pro, Pro-X, S3, and V4 (as they all use 0.25u IO transistors).

Austin

lecroy wrote:

Reply to
Austin Lesea

Hi Austin,

Spartan3 suports 5V using external resistors. So, I suppose I can also use a resistor for interface a signal that swings from -18V to +18V. Ok? There are internal diodes to VCC and GND, isn't it?

Luiz Carlos.

Reply to
Luiz Carlos

Luiz,

Yes, absolutely.

Examine the ASCII IBIS file and you will directly see the IV curve of the protection (clamp) diodes to ground, and Vcco.

Select your resistor value such that the current is less than 10 mA into the diodes, and everything is just fine.

Aust> Hi Austin,

Reply to
Austin Lesea

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