There are some degredation curves for common components given on p. 235 in this whitepaper from the Voyager program, looks like:
one from around the same time for neutron flux, military, stats-math-heavy:
Foreign paper (Malaysia), x-rays:
The first two look somewhat relevant but this data is pushing 40 years old. how relevant is it to bjts made using modern process? How accurate was it to begin with? there is probably more recent/detailed info out there but it sounds like the kind of thing that might require a clearance.
Could always do a FOIA request to the DOE as it's quite specific what you're looking for see if there's anything unclassified or no longer classified they might be willing to release.
another one from JPL that's mid 90s vintage, looks like, very topical but it's pretty bare-bones with respect to data, couple crappy graphs:
"Recent experience on the Cassini spacecraft project has shown that some bipolar devices exhibit large decreases in gain at low total dose levels, severely impacting their use in space. Figure 1 compares gain degradation of two small signal transistors, measured at the lowest collector current in the manufacturer?s specifications. The 2N918 transistor exhibits only small changes in gain with total dose, while the 2N3700 is severely degraded, even at levels below 10 krad(Si).
The gain loss is so severe that it is extremely difficult to use this device on the project, which must operate at levels between 50-100 krad(Si). This extreme degradation was not observed for earlier lots fl om the same manufacturer, and was greater than anticipated for any bipolar transistor with standard construction and normal breakdown voltage requirements."