Using FETs in parallel

Right. But I'd probably do that by fudging the source resistors, to even out case temps under load. The uP doesn't control the signal path, other than to shut it down.

John

Reply to
John Larkin
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Agreed, modeling/measuring the dissipation capabilities of each heat-sink location is an obvious good idea, and the result can be nicely "hardcoded" into the design with resistor values. That's something that has less impact on manufacturing. But we know it's not good to un-necessarily disturb a product flow and documentation. Next time, 'eh John?

--
 Thanks,
    - Win
Reply to
Winfield Hill

now thats a nice though. central FETs do less work....

do you run into any problems with thermal cycling? I saw an interesting paper not so long ago on thermal cycling failures in TO-247 packages; its the leading killer in big modules. dT/dt....

Cheers Terry

Reply to
Terry Given

AFAIUI, partly through better materials for the die attach and partly through reduced expectations on the part of users.

Best regards, Spehro Pefhany

--
"it\'s the network..."                          "The Journey is the reward"
speff@interlog.com             Info for manufacturers: http://www.trexon.com
Embedded software/hardware/analog  Info for designers:  http://www.speff.com
Reply to
Spehro Pefhany

I talked to one of the designers of the original circuit that I couldn't post because it is an internal company design. I didn't get much real info, but it looks like their unit was set up to provide a lot more current than we need. So I can likely get by with just one FET rather than using several in parallel. Regardless, I think this circuit will be more of a cutoff than a clamp. Certainly a cutoff will be simpler to make than a clamp which is essentially a regulator with a low dropout when driven by a low voltage.

Tomorrow we will hear what the customer thinks about this. The whole thing is currently up in the air because we signed up to meet one spec and the ICD from the customer is calling out another, tougher spec. Management wants to hit them up for more cash to meet the tougher specs. With the easier specs we can just use Vicor units COTS with a

100 msec hold up circuit on the output... but that's another design question. :-)

My preference would be to design a switching regulator that will operate between 16 and 100 VDC input. LTC has a part that may do the job. But I am a novice at power designs only having done a couple of lower power circuits using regulators with built in switches.

It certainly has been an interesting thread. I learned a lot about power circuits that I had no idea I didn't know. Sometimes that is the hard part, finding out what it is that you don't know, and usually you find out the hard way.

Reply to
rickman

Seems unnecessarily simplified. The heat capacity is a different matter than the steady-state dissipation. There should be a hard-coded distribution profile that is also a function of time. ;-)

Best regards, Spehro Pefhany

--
"it\'s the network..."                          "The Journey is the reward"
speff@interlog.com             Info for manufacturers: http://www.trexon.com
Embedded software/hardware/analog  Info for designers:  http://www.speff.com
Reply to
Spehro Pefhany

How was the problem fixed ?

Graham

Reply to
Pooh Bear
[snip]

Which is why my regulators in the TOW missile use steel cases instead of aluminum.

...Jim Thompson

-- | James E.Thompson, P.E. | mens | | Analog Innovations, Inc. | et | | Analog/Mixed-Signal ASIC's and Discrete Systems | manus | | Phoenix, Arizona Voice:(480)460-2350 | | | E-mail Address at Website Fax:(480)460-2142 | Brass Rat | |

formatting link
| 1962 | It's what you learn after you know it all that counts.

Reply to
Jim Thompson

Hmmm... phase change absorbs a lot of heat. Something that melts at, say, 80C could heatsink a semiconductor pretty well, while it lasts.

John

Reply to
John Larkin

"Spehro Pefhany" a écrit dans le message de news: snipped-for-privacy@4ax.com...

? They

level.

I remember a (I think Thomson CSF) databooks where there were two flavours of the same die, one inteded for fast cycling and one for slow (mainly on/off). The difference between both was the die attach solder material.

Never worked with these, (I'm too young :-) but this stroke me.

--
Thanks,
Fred.
Reply to
Fred Bartoli

"Spehro Pefhany" a écrit dans le message de news: snipped-for-privacy@4ax.com...

Hey, we did that to squize the most performance out of DPAK/D2PAK MOSFETs that were soldered on a thin stamped copper conductor-heatsink. We did a good job of accurately modeling the transistors internals (die-solder join-tab) so that we could accuratly predict the die temperature under transients and fault conditions. The purpose was to use the smallest die (100000s units a year with about 10 MOSFETS per unit).

--
Thanks,
Fred.
Reply to
Fred Bartoli

have a look at

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fig. 5.54.

summary:

dTj no. cycles (0.1% failure rate)

30 4E6 40 7E5 50 1.5E5 60 5E4 70 2E4 80 9E3 90 4E3 100 2E3

its pretty clear that if dTj < 30K you can completely ignore the problem. one simple solution is great heatsinking (some bloke called Larkin wrote a nice waffly story he kindly posted on the internet, well worth reading). full-pak packages are thus utter s**te in this respect (cue images of ricardo montalban's midget, pointing to picture of Arrhenius, shouting "derate, derate")

what they dont show in this graph is that its not so much dTj, its dTj/dt. if the temp rise is fast wrt die-attach thermal time constant, thats where the thermal stresses arise which lead to voids in the die-attach, increasing Rtheta....

another approach is to minimise dTj, leaving Tj_final the same. I have done this by varying Fswitch as a function of load, so at light load my devices switch quickly, and stay nice and hot - a constant-loss algorithm, if you will. as long as the algorithm acts faster than the relevant thermal time constant, dTj can be reduced to arbitrarily small values. best not to think about the electricity bill though :)

I had a quick squiz but couldnt find the TO-247 paper (if you saw my lab, you would understand :). ISTR the graphs looked similar. there have been many such papers on DCB modules, but this was the first one I have seen wrt TO-247.

Cheers Terry

Reply to
Terry Given

Problem in the TOW: Run time in seconds. No space for a finned heatsink, let alone moving air. So you use mass to store the heat. A sublimating sink is nice, but presents test and storage issues.

...Jim Thompson

--
|  James E.Thompson, P.E.                           |    mens     |
|  Analog Innovations, Inc.                         |     et      |
|  Analog/Mixed-Signal ASIC\'s and Discrete Systems  |    manus    |
|  Phoenix, Arizona            Voice:(480)460-2350  |             |
|  E-mail Address at Website     Fax:(480)460-2142  |  Brass Rat  |
|       http://www.analog-innovations.com           |    1962     |
             
      It\'s what you learn after you know it all that counts.
Reply to
Jim Thompson

It depends on the different thermal resistances especially that of the heatsink. If you make sure the die is effectively mounted on solid metal the time contant should be of the order of the diffusion time of the lump, which should be ~ 1 second. I'll concede that to be a reliable scientific statement I should change the scenario to slow music at 60bpm and assume one major beat per bar. I also need to learn to do arithmetic, which when done correctly then extends the life estimate to 11 hrs. No doubt some manufacturers would be c*ck-a-hoop to have achieved this 600 times improvement in reliability, but it's still a bit on the low side for most consumer goods :)

I ran into this problem with hefty bipolar transistors running electric wheelchair motors. I believe RCA changed the die mounting and the problem went away. OTOH, I have successfully melted the mounting material on TO3 (lidless!) MOSFETs and had perfectly good devices when they cooled down. Perhaps a periodical cook-up to remount and anneal the die is a good idea?

Reply to
Derek Potter

And of course the production engineer hiding (sometimes extremely well) within me doesnt want a plethora of differing source resistors, so s/w control would be preferrable.

Cheers Terry

Reply to
Terry Given

Anything especially pithy you can share with us?

--
 Thanks,
    - Win
Reply to
Winfield Hill

I havent bought it yet (US$170 - aargh), but I happened to spot a copy at Auckland University Engineering Library a month or so back, and had a quick shufti.

there is a lot of material on funny shaped [extrusions] to maximise surface area etc. for both air- and liquid-cooled heatsinks (my particular area of interest) - they both calculate and measure the amount of funny, and have a whole bunch of useful formulae, charts etc.

there are also sections on some seriously fancy techniques, like bathing hot bits with spray, (IIRC) phase change cooling, stuff like that.

I am at present trying to jack up some funding for a hefty piece of power electronics, and when I do I'll order a copy. next time im in AK, I plan to spend a good day or so having a more thorough squiz.

Cheers Terry

NB: Shufti, squiz = antipodean slang for "look"

Reply to
Terry Given

Even still, there can be extreme variation over the surface of a wafer, the only sure way is to test them both statically and dynamically. $$$$

--
JosephKK
Reply to
Joseph2k

you might be interested in this book:

Principles of Enhanced Heat Transfer, Webb & Kim, 1-59169-014-5

Cheers Terry

Reply to
Terry Given

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