At least one datasheet, from LT, says its input looks like a resistor to ground, when you load the input with a big bypass cap (i.e., a switched capacitor equivalent). That should suggest a switched-capacitor-to-ground topology, in which case the residual error from a proceeding conversion should be small, and the magnitude of charge required per conversion should be consistent (Q = CV, with C reasonably constant).
I wonder then (and I take it, you're wondering as well) how practical it is to, for instance, just repeat the measurement. Convert the input, discard, convert again, keep value. Move to next mux input and repeat. That should minimize any stored charge error.
You could also strap a "buffer" input to GND or VREF or some other convenient source, which presumably would have a constant-offset error rather than a constant-gain error. This would allow you to use an 8-wide mux for 7 inputs, but still at half the sample rate (set 1 = GND, then read
1, 2; 1, 3; 1, 4; ..).
Tim
--
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"Tim Wescott" wrote in message
news:BuCdnXDdHZurf3XSnZ2dnUVZ_vYAAAAA@web-ster.com...
> Any good white papers out there on the residual voltage to expect on a
> switched capacitor ADC after it reads a channel and goes on to read the
> next one?
>
> Assuming that it's not horrendously design dependent, of course.
>
> --
> My liberal friends think I'm a conservative kook.
> My conservative friends think I'm a liberal kook.
> Why am I not happy that they have found common ground?
>
> Tim Wescott, Communications, Control, Circuits & Software
> http://www.wescottdesign.com