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About random and systematic yield loss

Dear All

Currently I read about systematic yield and random yield effect on the overall yield of wafer. I have no idea how people actually group the systematic yield and random yield separately.

Do people get the overall yield from probing and then run statistically tool and analysis to get the systematic and random yield by some advanced curve fitting techniques?

OR some matrix of different conditions need to be run in order to find the systematic part of the sensitivity in yield loss?

I believe the first one should be more advisable.

Kindly enlighten. Thank you for your help in advance.

best regards Jason

Reply to
jasonclass
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snipped-for-privacy@gmail.com snipped-for-privacy@gmail.com posted to sci.electronics.design:

You need to understand the terms in regard to general manufacturing first. Then the specific application to IC's and wafers follows with minimal effort.

Reply to
JosephKK

Dear Joseph

Thanks a lot

Any links you could share for understanding the general term and calculation of each term?

Thank you Jas> snipped-for-privacy@gmail.com snipped-for-privacy@gmail.com posted to

Reply to
jason0class

snipped-for-privacy@gmail.com snipped-for-privacy@gmail.com posted to sci.electronics.design:

While i generally don't do your googling for you, i will test for some useful search strings and show some hopefully useful links:

search strings:

random yield losses systematic yield losses yield loss modeling

links: holomirage.com/Articles/TI_CAL.doc

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Reply to
JosephKK

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