As I understand, Boundary Scan compliant devices can be used for to make sure you don't have any shorts or opens between boundary scan devices... but what about analog functionality?
For example, if a 1149.1 compliant microcontrollers has a built-in D/ A, can a ATPG test be written such that the full analog swing of the pin can be tested? Or is TDI/TDO restricted to logic levels only and arn't meant for analog testing?
If not, anyone know if the new JTAG standards coming down the road (1149.7, P1587) will have such support? I'd like to use a board test that actually tests some board functionality logic instead of just shorts/opens!